Patent · US Active

Film forming method and film forming apparatus

US11879067B2 · kind B2 · utility

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7Claims
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Key dates

Filing dateOct 31, 2019
Grant dateJan 23, 2024
Priority date
Expiry dateOct 31, 2039

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/0271
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A film forming method is a method of forming a film on a substrate top face including a first region in which a metal or a semiconductor is exposed and a second region in which an insulator is exposed. The method includes a SAM forming process of forming a self-assembled monolayer film of a perfluoropolyether group-containing compound on the first region and a film growth process of forming a predetermined film on the second region after execution of SAM forming process.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.