Automated power noise susceptibility test system for storage device
US11880252B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 4, 2021 |
| Grant date | Jan 23, 2024 |
| Priority date | — |
| Expiry date | Aug 13, 2042 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH03F2203/45528
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Automated power noise susceptibility test systems are provided for one or more storage devices. A system includes a host; storage devices; and multiple noise injection modules. Each noise injection module includes: a first relay to a third relay, which are coupled to a first path or a second path. The first path includes: an operational amplifier for generating a high noise function; a first variable regulator for generating a first or second regulated power supply voltage; and a capacitor injection circuit for generating low noise function and a first power noise. The second path includes: a second variable regulator for generating a third or fourth regulated power supply voltage and a power amplifier injection circuit for generating a second power noise. The third relay selectively provides the storage device the first power noise or the second power noise.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.