Patent · US Active

Profiling a program based on a combination of dynamic instrumentation and sampling

US11892936B2 · kind B2 · utility

0Cited by
5References
17Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 11, 2022
Grant dateFeb 6, 2024
Priority date
Expiry dateAug 5, 2042

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F2201/865
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A computer system is configured to profile a program during an execution of the program. Profiling the program includes obtaining, by a first profiler, a first set of information associated with the execution of the program, and obtaining a second set of information associated with one or more executions of the function. The second set of information includes at least a call count or an execution time of each of the one or more executions of the function. The computer system then identifies a subset of the first set of information that is associated with the one or more executions of the function, and creates aggregate information based on the subset of the first set of information and the second set of information. The aggregated information is then reported.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.