Inventor · Redmond, WA, US

Patrick Lothian Nelson

19Patents
4h-index
28Co-inventors
52Inventor score

Filing activity: Jan 15, 2014 → Jan 10, 2023

Most-cited inventions

PatentTitleAreaCited byStatus
US10698792B2 Execution control with cross-level trace mapping Physics 8 Active
US10541042B2 Level-crossing memory trace inspection queries Physics 7 Active
US9239774B2 Classification of JavaScript code for debugging using just my code Physics 5 Active
US10747645B2 Selectively tracing portions of computer process execution Physics 4 Active
US11113182B2 Reversible debugging in a runtime environment Physics 1 Active
US10956304B2 Dynamic diagnostic code instrumentation over a historic program execution Physics 1 Active
US9424163B2 Exception and debugging behaviors for JavaScript debugging using just my code Physics 1 Active
US9208060B1 Emulation-based expression evaluation for diagnostic tools Physics 1 Active
US10740219B2 Selectively tracing portions of computer process execution Physics 1 Active
US10877873B2 Using historic execution data to visualize tracepoints Physics 1 Active
US11074153B2 Collecting application state in a runtime environment for reversible debugging Physics 1 Active
US12124826B2 Instrumentation-based detection of accidental algorithmic complexity of a procedure Physics 0 Active
US11249881B2 Selectively tracing portions of computer process execution Physics 0 Active
US11138093B2 Identifying data inconsistencies and data contention based on historic debugging traces Physics 0 Active
US11892936B2 Profiling a program based on a combination of dynamic instrumentation and sampling Physics 0 Active
US10592396B2 Memory validity states in time-travel debugging Physics 0 Active
US11392482B2 Data breakpoints on certain kinds of functions Physics 0 Active
US11132280B2 Automatically identifying and highlighting differences between historic traces Physics 0 Active
US11604720B2 Identifying data inconsistencies and data contention based on historic debugging traces Physics 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.