Stack-based ray traversal with dynamic multiple-node iterations
US11908065B2 · kind B2 · utility
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Key dates
| Filing date | Jun 20, 2022 |
| Grant date | Feb 20, 2024 |
| Priority date | — |
| Expiry date | Jun 20, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2210/21
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A technique for performing ray tracing operations is provided. The technique includes, in response to detecting that a threshold number of traversal stage work-items of a wavefront have terminated, increasing intersection test parallelization for non-terminated work-items.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.