Patent · US Active

Substrate processing method and substrate processing apparatus

US11908680B2 · kind B2 · utility

0Cited by
7References
12Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 17, 2021
Grant dateFeb 20, 2024
Priority date
Expiry dateDec 17, 2041

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/67109
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A substrate processing method includes a first process of supplying an etching liquid to a peripheral portion of a substrate while rotating the substrate having a metal polycrystalline film formed on a front surface thereof; a second process of supplying a rinse liquid to a portion of the substrate closer to a center side of the substrate than a supply position of the etching liquid in the first process while rotating the substrate; a third process of supplying the etching liquid to the peripheral portion of the substrate while rotating the substrate; a fourth process of supplying the rinse liquid to a portion of the substrate closer to the center side of the substrate than a supply position of the etching liquid in the third process while rotating the substrate; and a fifth process of drying the substrate after the fourth process.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.