System and method for binning at final test
US11919046B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 22, 2021 |
| Grant date | Mar 5, 2024 |
| Priority date | — |
| Expiry date | Aug 19, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2894
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method of sorting an electronic device includes receiving first data generated by a test tool that is performing a test operation on the electronic device according to a test program, and a provisional binning assignment for the electronic device determined from the first data. The method also includes defining a permanent binning assignment for the electronic device based at least in part on applying a first algorithm and a second algorithm to the first data, the first algorithm and the second algorithm being different. The method further includes outputting the permanent binning assignment so that after the test operation is completed, the electronic device is removed from the test tool and placed in one of a plurality of bins according to the permanent binning assignment.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.