Method for detecting emission light, detection device and laser scanning microscope

US11921274B2 · kind B2 · utility

Assignee

• Carl Zeiss Microscopy GmbH · DE

Inventors

• Daniel Schwedt · Weimar, DE
• Tiemo Anhut · Jena, DE
• Peter Schacht · Erfurt, DE

Key dates

• Filing date: Jul 29, 2021
• Grant date: Mar 5, 2024
• Expiry date: Jul 29, 2041

Classification

• Technology area (CPC G): Physics
• CPC primary: G01N2021/6423
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

Detecting emission light, in a laser scanning microscope, wherein the emission light emanating from a sample is guided onto a two-dimensional matrix sensor having a plurality of pixels and being located on an image plane, and a detection point distribution function is detected by the matrix sensor in a spatially oversam pled manner. The emission light emanating from the sample is spectrally separated in a dispersion device; the spectrally separated emission light is detected by the matrix sensor in a spectrally resolved manner; and during the analysis of the intensities measured by the pixels of a pixel region, the spectral separation is cancelled at least for some of said pixels. Additional aspects relate to a detection device for the spectrally resolved detection of emission light in a laser scanning microscope and to a laser scanning microscope.