Test method and apparatus of communication chip, device and medium
US11927631B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 6, 2020 |
| Grant date | Mar 12, 2024 |
| Priority date | — |
| Expiry date | Jul 1, 2040 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04L1/244
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Provided test method and apparatus of communication chip, device and medium. The test method of communication chip includes receiving end test method and transmitting end test method. The receiving end test method of the communication chip includes: an idle time slot of the receiving end of the communication chip is detected in a running process of the communication chip; a test vector is generated, and a standard result corresponding to the test vector is generated; a data frame containing the test vector is constructed, and the data frame is sent to the receiving end of the communication chip in the idle time slot to enable the receiving end of the communication chip to process the data frame; and a chip processing result uploaded by the receiving end of the communication chip is received, and the standard result is compared with the chip processing result.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.