Yun-Chi Yang
10Patents
2h-index
19Co-inventors
51Inventor score
Filing activity: Nov 11, 2000 → May 6, 2020
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6326220A | Method for determining near-surface doping concentration | Electricity | 12 | Expired |
| US7754611B2 | Chemical mechanical polishing process | Electricity | 11 | Active |
| US7589551B1 | On-wafer AC stress test circuit | Physics | 2 | Active |
| US6790746B1 | Method for improvement of edge breakdown caused by edge electrical field at a tunnel oxide of a high-density flash memory by a shielded bird's beak | Electricity | 2 | Expired |
| US7341910B2 | Method for forming a flash memory by using a microcrystalline polysilicon layer as a floating gate | Electricity | 1 | Expired |
| US7199018B2 | Plasma assisted pre-planarization process | Electricity | 1 | Expired |
| US7544618B2 | Two-step chemical mechanical polishing process | Electricity | 0 | Active |
| US8510635B2 | Method for evaluating failure rate | Physics | 0 | Active |
| US11927631B2 | Test method and apparatus of communication chip, device and medium | Electricity | 0 | Active |
| US7659167B2 | Method for improving the performance of flash memory by using microcrystalline silicon film as a floating gate | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.