Method for testing memory
US11929137B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Nov 17, 2021 |
| Grant date | Mar 12, 2024 |
| Priority date | — |
| Expiry date | May 18, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C2207/2254
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
The present application provides a method for testing a memory, including the steps of: providing a database, the database including a deviation value between a data strobe signal and a clock signal and a corresponding relationship between the deviation value and a memory parameter; searching the database for a deviation value corresponding to a preset memory parameter when a read command is applied to the memory under the preset memory parameter; acquiring a time value at which an output signal is to be captured according to the deviation value; and capturing the output signal at the time value to perform the testing for the memory.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.