Yangyang Dai
3Patents
0h-index
5Co-inventors
24Inventor score
Filing activity: Apr 2, 2021 → Oct 20, 2022
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US12340525B2 | High-definition map creation method and device, and electronic device | Physics | 0 | Active |
| US11409623B2 | Integrated circuit (IC) power-up testing method and device, and electronic equipment | Physics | 0 | Active |
| US11929137B2 | Method for testing memory | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.