Material profiling for improved sizing accuracy
US11933766B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 10, 2022 |
| Grant date | Mar 19, 2024 |
| Priority date | — |
| Expiry date | May 21, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2291/267
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A material profile can be determined by assuming an elliptical or circular arc geometry and by using acoustic noise generated by diffuse internal reflection and/or specular reflection on the internal (ID) or external (OD) interface of the material under inspection, such as a pipe or curved plate. A non-destructive testing (NDT) technique can acquire acoustic data of the material using an ultrasonic signal. The acquired acoustic data can be filtered such that the acoustic noise generated by diffuse internal reflection and/or specular reflection is separated from any flaws in the material. Positions of the acoustic noise can be determined and then a regression technique can be applied to the positions, which can generate an equation of a circle, for example, such as to provide a radius and thickness of the pipe or curved plate.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.