Patent · US Active

Chemical mechanical planarization pads with constant groove volume

US11938584B2 · kind B2 · utility

0Cited by
4References
10Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 7, 2020
Grant dateMar 26, 2024
Priority date
Expiry dateMay 19, 2042

Classification

  • Technology area (CPC C)Chemistry; Metallurgy
  • CPC primaryC08L75/04
  • WIPO fieldMachine tools
  • WIPO sectorMechanical engineering

Abstract

A chemical mechanical polishing pad includes a surface portion of a first material. The surface portion includes a plurality of grooves. A first portion of the grooves are exposed grooves located at a surface of the chemical mechanical polishing pad. A second portion of the grooves are buried grooves embedded below the surface of the chemical mechanical polishing pad, such that, during use of the chemical mechanical polishing pad, one or more of the buried grooves are exposed at the surface.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.