Zoned memory device recovery after a key-value store failure
US11941258B2 · kind B2 · utility
0Cited by
3References
20Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Feb 21, 2023 |
| Grant date | Mar 26, 2024 |
| Priority date | — |
| Expiry date | Feb 21, 2043 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/07
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A system includes a memory device, and a processing device, operatively coupled with the memory device, to perform operations including detecting a failure of a key-value store, identifying a non-filled zone of the memory device resulting from the failure, wherein the non-filled zone stores, in the key-value store, at least one of: an uncommitted key block or an uncommitted value block, and recovering the non-filled zone to obtain a recovered zone.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.