Method of image evaluation for sim microscopy and sim microscopy method

US11954831B2 · kind B2 · utility

Assignee

• Carl Zeiss Microscopy GmbH · DE

Inventors

• Ingo Kleppe · Jena, DE
• Yauheni Novikau · Jena, DE
• Lutz Schaefer · Kitchener, CA

Key dates

• Filing date: Sep 7, 2021
• Grant date: Apr 9, 2024
• Expiry date: Nov 23, 2042

Classification

• Technology area (CPC G): Physics
• CPC primary: G06T2207/10152
• WIPO field: Computer technology
• WIPO sector: Electrical engineering

Abstract

A method of image evaluation when performing SIM microscopy on a sample includes: A) providing n raw images of the sample, which were each generated by illuminating the sample with an individually positioned SIM illumination pattern and imaging the sample in accordance with a point spread function, B) providing (S1) n illumination pattern functions, which each describe one of the individually positioned SIM illumination patterns, C) providing (S1) the point spread function and D) Carrying out an iteration method, which includes following iteration steps a) to e), as follows: a) providing an estimated image of the sample, b) generating simulated raw images, in each case by image processing of the estimated image using the point spread function and one of the n illumination pattern functions such that n simulated raw images are obtained, c) assigning each of the n simulated raw images to that of the n provided raw images which was generated by the illumination pattern that corresponds to the illumination pattern function used to generate the simulated raw image, and calculating n correction raw images by the comparison of each provided raw image with the simulated raw image assigned …