Testing of on-chip analog-mixed signal circuits using on-chip memory
US11961577B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 5, 2022 |
| Grant date | Apr 16, 2024 |
| Priority date | — |
| Expiry date | Nov 16, 2042 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH03M3/464
- WIPO fieldBasic communication processes
- WIPO sectorElectrical engineering
Abstract
Analog-to-digital converters (ADCs) of an integrated circuit includes a first set of ADCs and second set of ADCs in which the ADCs of the first set are of a different type than the ADCs of the second set. On-chip testing of the ADCs includes calibrating an N-bit differential digital-to-analog converter (DAC) and storing a pair of calibration codes for each of 2N possible DAC input codes for the DAC in an on-chip memory. The first set of ADCs is tested using the pairs of calibration codes stored in the on-chip memory and a full N-bit resolution of the DAC. Subsequently, the second set of ADCs is tested using pairs of calibration codes corresponding to a reduced M-bit resolution of the DAC, in which M is less than N. During the testing of the second set of ADCs, a portion of the calibration codes stored in the on-chip memory is overwritten.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.