Image processing device, work robot, substrate inspection device, and specimen inspection device
US11972589B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 9, 2019 |
| Grant date | Apr 30, 2024 |
| Priority date | — |
| Expiry date | Feb 12, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30141
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
The image processing device comprises: a storage section storing a three-dimensional shape model in which feature amounts and three-dimensional positional information, for multiple feature points of a target object, are associated; an extraction process section configured to extract the feature amounts and two-dimensional positional information of the feature points from a two-dimensional image of the target object captured with a camera; and a recognition process section configured to identify three-dimensional positional information of the feature points of the two-dimensional image and recognize the position and orientation of the target object by matching the feature points of the two-dimensional image with the feature points of the three-dimensional model using the feature amounts.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.