Masato Iwabuchi
10Patents
8h-index
22Co-inventors
72Inventor score
Filing activity: Aug 4, 1978 → Jan 9, 2019
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5477067A | Semiconductor IC device having a RAM interposed between different logic sections and by-pass signal lines extending over the RAM for mutually connecting the logic sections | Emerging Cross-Sectional Technologies | 88 | Expired |
| US5481484A | Mixed mode simulation method and simulator | Physics | 44 | Expired |
| US5243208A | Semiconductor integrated circuit device having a gate array with a ram and by-pass signal lines which interconnect a logic section and I/O unit circuit of the gate array | Emerging Cross-Sectional Technologies | 19 | Expired |
| US4959704A | Semiconductor integrated circuit device | Emerging Cross-Sectional Technologies | 15 | Expired |
| US4970687A | Semiconductor memory device having a timing generator circuit which provides a write pulse signal which has an optional timing relationship with the chip select signal | Physics | 14 | Expired |
| US5388073A | Semiconductor integrated circuit device and digital processor employing the same | Physics | 13 | Expired |
| US5103282A | Semiconductor integrated circuit device having a gate array with a RAM and by-pass signal lines which interconnect a logic section and I/O unit circuit of the gate array | Emerging Cross-Sectional Technologies | 11 | Expired |
| US5399912A | Hold-type latch circuit with increased margin in the feedback timing and a memory device using same for holding parity check error | Electricity | 9 | Expired |
| US4219369A | Method of making semiconductor integrated circuit device | Emerging Cross-Sectional Technologies | 6 | Expired |
| US11972589B2 | Image processing device, work robot, substrate inspection device, and specimen inspection device | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.