Method for particle analysis and method for particle production
US11988636B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Apr 24, 2020 |
| Grant date | May 21, 2024 |
| Priority date | — |
| Expiry date | Jan 4, 2043 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2333/39
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The method for particle analysis includes a first magnetic susceptibility measurement step S4 of measuring a volume magnetic susceptibility of each of first particles p1; an encapsulation treatment step S5 of performing an encapsulation treatment so that the first particles p1 encapsulate an encapsulation target component pt smaller than the first particles p1; a second magnetic susceptibility measurement step S8 of measuring a volume magnetic susceptibility of each of second particles p2 as an analysis target that are the first particles p1 after the encapsulation treatment; and a step S9 of analyzing whether or not the encapsulation target component pt is encapsulated in the second particles p2 based on a result of measurement in the first magnetic susceptibility measurement step S4 and a result of measurement in the second magnetic susceptibility measurement step S8.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.