System, method and apparatus for macroscopic inspection of reflective specimens
US11995802B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 26, 2023 |
| Grant date | May 28, 2024 |
| Priority date | — |
| Expiry date | May 26, 2043 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N23/50
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
An inspection apparatus includes a specimen stage, one or more imaging devices and a set of lights, all controllable by a control system. By translating or rotating the one or more imaging devices or specimen stage, the inspection apparatus can capture a first image of the specimen that includes a first imaging artifact to a first side of a reference point and then capture a second image of the specimen that includes a second imaging artifact to a second side of the reference point. The first and second imaging artifacts can be cropped from the first image and the second image respectively, and the first image and the second image can be digitally stitched together to generate a composite image of the specimen that lacks the first and second imaging artifacts.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.