Methods and systems for component analysis, sorting, and sequencing based on component parameters and devices utilizing the methods and systems
US12002720B2 · kind B2 · utility
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29Claims
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Key dates
| Filing date | Nov 23, 2020 |
| Grant date | Jun 4, 2024 |
| Priority date | — |
| Expiry date | Aug 7, 2041 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY04S30/12
- WIPO fieldSemiconductors
- WIPO sectorElectrical engineering
Abstract
A process includes measuring at least one component parameter of a plurality of components with a testing device; and arranging at least a portion of the plurality of components in a sequential order based on the at least one component parameter with an implementation system in at least one of the following: a shipping format and a device implementation of the portion of the plurality of components. A system is disclosed as well.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.