Microscopy system, method and computer program for aligning a specimen carrier
US12007547B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 17, 2021 |
| Grant date | Jun 11, 2024 |
| Priority date | — |
| Expiry date | Jan 7, 2043 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02B21/365
- WIPO fieldOptics
- WIPO sectorInstruments
Abstract
Aligning a sample carrier of a microscope includes: capturing an overview image in which the sample carrier and/or a sample carrier environment is at least partially visible; evaluating the overview image with a machine learning model of a computer program, which performs an object localization in the overview image with respect to at least one predefined object; evaluating whether the sample carrier is centred in the overview image with the computer program based on the object localization; if the sample carrier is evaluated as not centred in the overview image: determining a centring movement based on the object location with the computer program, the centring movement indicating a sample stage movement for moving the sample carrier towards an image centre of the overview image; performing a sample stage adjustment based on the centring movement; and capturing a centred overview image after the sample stage adjustment has been performed.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.