Patent · US Active

Photoresist coating method

US12020932B2 · kind B2 · utility

0Cited by
2References
8Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 19, 2022
Grant dateJun 25, 2024
Priority date
Expiry dateSep 19, 2042

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG03F7/162
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

The invention provides a photoresist coating method, which comprises the following steps: providing a wafer with a pattern on the wafer, placing the wafer on a spinner, injecting a photoresist on a central region of the wafer from a nozzle, and carrying out a spin coating step, the spin coating step comprises: turning on the spinner to rotate the spinner to a first rotation speed, and raising the first rotation speed to a second rotation speed, and performing a plurality of brakes during the process of maintaining the second rotation speed, so that the second rotation speed instantly drops to a third rotation speed, and then rises to the second rotation speed again.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.