Patent · US Active

Method for producing a wafer connection

US12030773B2 · kind B2 · utility

0Cited by
2References
16Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 24, 2019
Grant dateJul 9, 2024
Priority date
Expiry dateSep 24, 2039

Classification

  • Technology area (CPC B)Performing Operations; Transporting
  • CPC primaryB81C2203/0792
  • WIPO fieldMicro-structural and nano-technology
  • WIPO sectorChemistry

Abstract

A method for producing a wafer connection between a first and a second wafer. The method includes providing a first and second material for forming a eutectic alloy, providing a first wafer having a receiving structure for a die structure, filling the receiving structure with the first material, providing a second wafer having a die structure, the second material being situated on the die structure, providing a stop structure on the first and/or second wafer, so that when the two wafers are joined, a defined stop is provided, heating the first and second material at least to the eutectic temperature of the eutectic alloy, joining the first and second wafer so that the die structure is at least partly introduced into the receiving structure, the stop structure, the receiving structure, the die structure.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.