Patent · US Active

Testing device and method for testing a device under test

US12032001B2 · kind B2 · utility

0Cited by

3References

15Claims

0Family size

Assignees

ADVANCED SEMICONDUCTOR ENGINEERING, INC. · TW
ASE TEST, INC.

Inventors

Jia Jin Lin · Kaohsiung, TW
Chia-Hsiang Wang · New Taipei, TW
Shih Pin Chung · Kaohsiung, TW
Wei Shuo Chu · Kaohsiung, TW
You Lin Lee · Kaohsiung, TW
Pin Heng Kuo · Kaohsiung, TW
Cheng Chia Tu · Kaohsiung, TW

Key dates

Filing date	Apr 15, 2022
Grant date	Jul 9, 2024
Priority date	—
Expiry date	Jul 1, 2042

Classification

Technology area (CPC G)Physics
CPC primaryG01R31/2863
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A testing device is disclosed. The testing device includes a socket configured to support a DUT and a first detection module disposed at a first side of the socket and configured to detect a location relationship between the DUT and the socket.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.