Patent · US Active

Fast effective resistance estimation using machine learning regression algorithms

US12032889B2 · kind B2 · utility

0Cited by
4References
20Claims
0Family size

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Key dates

Filing dateMar 2, 2021
Grant dateJul 9, 2024
Priority date
Expiry dateJun 14, 2042

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06N20/10
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

Various embodiments of a method and apparatus for estimating the effective resistance for the design of on-chip power nets are disclosed. Through sampled node resistance, performance of a power net can be determined on an entire chip. Effective resistance predictions can be made for all nodes. Through the resistance predictions, a designer can analyze the which areas would benefit from power and ground augmentation.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.