High sensitivity phase microscopy imaging
US12038569B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Sep 4, 2019 |
| Grant date | Jul 16, 2024 |
| Priority date | — |
| Expiry date | Aug 3, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02B21/365
- WIPO fieldOptics
- WIPO sectorInstruments
Abstract
A device for phase microscopy is disclosed that comprises a spatial light modulator and a connecting means adapted to fix the spatial light modulator onto a phase microscope. The phase microscope comprises a light path comprising at least a sample area, a light device for lighting said sample area, and an imaging device for capturing a phase image of said sample area. The phase image is a 2D matrix of pixels. The spatial light modulator is positioned in the light path in a conjugated plane of the sample area. The device also comprises a command of the spatial light modulator connected to the imaging device and adapted to measure the phase shift of a plurality of pixels of the phase image and to command the spatial light modulator in order to subtract the measured phase shifts.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.