Thomas Juffmann
2Patents
0h-index
6Co-inventors
21Inventor score
Filing activity: May 28, 2019 → Sep 4, 2019
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US12038569B2 | High sensitivity phase microscopy imaging | Physics | 0 | Active |
| US11456148B2 | Aberration reduction in multipass electron microscopy | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.