Patent · US Active

Film formation apparatus and moisture removal method thereof

US12043898B2 · kind B2 · utility

0Cited by
1References
13Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 12, 2021
Grant dateJul 23, 2024
Priority date
Expiry dateFeb 12, 2041

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01J37/3488
  • WIPO fieldSurface technology, coating
  • WIPO sectorChemistry

Abstract

According to one embodiment, a film formation apparatus and a moisture removing method thereof that can facilitate the removement of moisture in the chamber without the complication of the apparatus are provided. The film formation apparatus according to the present embodiment includes the chamber 10 which an interior thereof can be made vacuum, the exhauster 20 that exhausts the interior of the chamber 10, the carrier 30 that circularly carries the workpiece W by a rotation table 31 provided inside the chamber 10, and the plurality of the plasma processor 40 that performs plasma processing on the workpiece W which is circularly carried, in which the plurality of the plasma processor 40 each has the processing spaces 41 and 42 to perform the plasma processing, at least one of the plurality of the plasma processor 40 is the film formation processor 410 that performs film formation processing by sputtering on the workpiece W which is circularly carried, and at least one of the plurality of the plasma processor 40 is the heater 420 that removes moisture in the chamber 10 by producing plasma and heating the interior of the chamber 10 via the rotation table 31 together with exhaustion b…

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.