Microscope and method for determining a distance to a sample reference plane
US12055380B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 14, 2021 |
| Grant date | Aug 6, 2024 |
| Priority date | — |
| Expiry date | Jan 26, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02B21/365
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for determining a distance of a sample reference plane of a sample carrier from a reference plane of a microscope, the microscope including a sample stage for the sample carrier and a camera, comprises the following steps: taking an overview image of the sample carrier by means of the camera; evaluating the overview image and thus detecting at least one characteristic of the sample carrier; ascertaining contextual data of the characteristic from a data set; and determining the distance of the sample reference plane from the reference plane based on the characteristic and the contextual data of the sample carrier. A microscope configured to determine the distance of the sample reference plane of the sample carrier from the reference plane is also described.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.