Stress properties measurement method, device, and system correlated based on stress gradients on multiple regions
US12066343B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Sep 7, 2021 |
| Grant date | Aug 20, 2024 |
| Priority date | — |
| Expiry date | Jul 15, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30236
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A stress properties measurement method for measuring properties of stresses generated in a structure includes acquiring, from a first imaging device, a plurality of thermal images corresponding to temperatures of a surface of the structure, the plurality of thermal images being different in imaging time from each other, generating a stress distribution image corresponding to each of the plurality of thermal images, acquiring a stress value of a first section that is smaller in stress gradient than a predetermined value and respective stress values of a plurality of second sections where stresses are concentrated for the stress distribution images, and deriving correlation properties of stresses at a section of the structure based on the stress value of the first section acquired and the respective stress values of the plurality of second sections acquired.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.