Yousuke Irie
25Patents
12h-index
23Co-inventors
81Inventor score
Filing activity: Oct 28, 1993 → Feb 24, 2022
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5691936A | Magnetoresistive element and memory element | Physics | 115 | Expired |
| US5715121A | Magnetoresistance element, magnetoresistive head and magnetoresistive memory | Emerging Cross-Sectional Technologies | 102 | Expired |
| US5841611A | Magnetoresistance effect device and magnetoresistance effect type head, memory device, and amplifying device using the same | Physics | 67 | Expired |
| US6724580B2 | Actuator with piezoelectric member | Electricity | 43 | Expired |
| US6111782A | Magnetoresistance effect device, and magnetoresistance effect type head, memory device, and amplifying device using the same | Physics | 42 | Expired |
| US6005798A | Magnetoresistance effect device, and magnetoresistance effect type head, memory device, and amplifying device using the same | Physics | 40 | Expired |
| US6903491B2 | Piezoelectric element, actuator, and inkjet head | Performing Operations; Transporting | 33 | Expired |
| US5459687A | Memory element | Physics | 27 | Expired |
| US6400537B2 | Thin film magnetic head | Physics | 25 | Expired |
| US6084752A | Thin film magnetic head | Physics | 15 | Expired |
| US6256222A | Magnetoresistance effect device, and magnetoresistaance effect type head, memory device, and amplifying device using the same | Physics | 13 | Expired |
| US6943990B1 | Head support mechanism, information recording/reproducing apparatus, and method of manufacturing head support mechanism | Physics | 12 | Expired |
| US10830652B2 | Stress measurement device, stress measurement system, and stress measurement method | Physics | 7 | Active |
| US7507297B2 | Cleaning method and cleaning apparatus | Emerging Cross-Sectional Technologies | 2 | Expired |
| US10900844B2 | Stress distribution measurement method and stress distribution measurement system | Physics | 2 | Active |
| US11808657B2 | Stress distribution image processing device | Physics | 1 | Active |
| US11467046B2 | Stress measurement method, stress measurement device, and stress measurement system | Physics | 1 | Active |
| US12066343B2 | Stress properties measurement method, device, and system correlated based on stress gradients on multiple regions | Physics | 0 | Active |
| US11275005B2 | Fatigue limit stress specification system, fatigue limit stress specification device, and fatigue limit stress specification method | Physics | 0 | Active |
| US12073549B2 | Stress analysis device | Physics | 0 | Active |
| US12092538B2 | Stress analysis device for moving body | Physics | 0 | Active |
| US11761833B2 | Stress measurement device, stress measurement system, and stress measurement method | Physics | 0 | Active |
| US11054252B2 | Thickness measurement method, thickness measurement device, defect detection method, and defect detection device | Physics | 0 | Active |
| US11965735B2 | Thickness measurement method, thickness measurement device, defect detection method, and defect detection device | Physics | 0 | Active |
| US11906370B2 | Stress distribution measurement method and stress distribution measurement system | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.