Patent · US Active

Debug state machine triggered extended performance monitor counter

US12072378B2 · kind B2 · utility

0Cited by
4References
20Claims
0Family size

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Inventor

Key dates

Filing dateDec 9, 2019
Grant dateAug 27, 2024
Priority date
Expiry dateApr 26, 2040

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F11/3698
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

An integrated circuit (IC) includes a debug controller, a debug state machine (DSM), and an extended performance monitor counter (EPMC). The debug controller that selectively outputs debug data on a debug interconnect. The DSM identifies an event based on the debug data and an event list and outputs a DSM indication that identifies the event. The EPMC indicates a plurality of detected events including the identified event. The EPMC indicates the identified event in response to the DSM indication.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.