Measurement apparatus, control apparatus, and control method
US12078478B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 3, 2021 |
| Grant date | Sep 3, 2024 |
| Priority date | — |
| Expiry date | Oct 7, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/10012
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A measurement apparatus includes a sensor that measures a workpiece, a multi-axis robot that moves the sensor in a three-dimensional space, a position determination part that determines i) a plurality of measurement positions that are positions along a normal direction at each of a plurality of positions to be measured on the workpiece and ii) a direction of the sensor at each of the plurality of measurement positions on the basis of at least either design data or captured image data indicating the geometry of the workpiece, a moving control part that sequentially moves the sensor to the plurality of measurement positions by controlling the robot, and a measurement control part that outputs measured data indicating a result that the sensor measured at each of the plurality of measurement positions in association with the plurality of positions to be measured.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.