Patent · US Active

Photoresist compositions and pattern formation methods

US12085854B2 · kind B2 · utility

0Cited by
6References
18Claims
0Family size

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Inventors

Key dates

Filing dateSep 30, 2021
Grant dateSep 10, 2024
Priority date
Expiry dateMar 10, 2042

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG03F7/0397
  • WIPO fieldOptics
  • WIPO sectorInstruments

Abstract

A photoresist composition comprising a polymer, a photoacid generator, an additive comprising a tertiary carbon atom as a ring-forming atom of a lactone ring, and a solvent.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.