Patent · US Active

Microscopy system and method for generating a virtually stained image

US12087041B2 · kind B2 · utility

0Cited by
2References
18Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 30, 2022
Grant dateSep 10, 2024
Priority date
Expiry dateMay 30, 2042

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06T2207/30168
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A method generates an image processing model to calculate a virtually stained image from a microscope image. The image processing model is trained using training data comprising microscope images as input data into the image processing model and target images that are formed via chemically stained images registered locally in relation to the microscope images. The image processing model is trained to calculate virtually stained images from the input microscope images by optimizing an objective function that captures a difference between the virtually stained images and the target images. After a number of training steps, at least one weighting mask is defined using one of the chemically stained images and an associated virtually stained image calculated after the number of training steps. In the weighting mask, one or more image regions are weighted based on differences between locally corresponding image regions in the virtually stained image and in the chemically stained image. Subsequent training considers the weighting mask in the objective function.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.