High-fidelity measurement of bosonic modes
US12093785B2 · kind B2 · utility
1Cited by
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12Claims
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Key dates
| Filing date | Nov 13, 2020 |
| Grant date | Sep 17, 2024 |
| Priority date | — |
| Expiry date | May 8, 2043 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F30/3308
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
High-fidelity measurements of qubits are achieved by increasing a number of measurements taken by use of a swap operation and a readout qubit, deflating a bosonic qubit for which measurement outcomes are affected by single photon/phonon loss events, deflating a bosonic qubit enabling readout in other basis, and evolving the qubit under a Hamiltonian that couples a mode to be measured to another mode where the Hamiltonian is selected from a three wave mixing interaction, and/or a combination of these techniques.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.