Method and microscope for generating an overview image of a sample
US12099174B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 11, 2021 |
| Grant date | Sep 24, 2024 |
| Priority date | — |
| Expiry date | Oct 11, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06N3/045
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method for generating an overview image of a sample which is arranged in an observation volume of a microscope by means of a sample carrier is proposed, wherein the sample carrier is illuminated by a first illumination, wherein a preliminary overview image is generated using the first illumination and an overview camera of the microscope, wherein an overview image illumination is chosen on the basis of the preliminary overview image, wherein the sample carrier is illuminated by the overview illumination, and wherein the overview image is generated using the overview image illumination and the overview camera.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.