Bipolar transistor having collector with doping concentration discontinuity
US12113125B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 29, 2022 |
| Grant date | Oct 8, 2024 |
| Priority date | — |
| Expiry date | Sep 8, 2042 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10D62/85
Abstract
This disclosure relates to bipolar transistors, such as heterojunction bipolar transistors, having increased collector thickness for improved ruggedness. In some embodiments, the collector thickness can be above 1.1 microns. The collector can have at least one doping concentration grading. The collector can have a high doping concentration at a junction between the collector and the sub-collector, such as at the high end of the grading. In some embodiments, the high doping concentration can be above about 9×1016 cm−3. The collector can include a region with high doping concentration adjacent the base. The collector can include a discontinuity in the doping concentration, such as at the low end of the grading. Such bipolar transistors can be implemented, for example, in power amplifiers.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.