Patent · US Active

Referencing pose manipulation system for marker based tracking of position measurement system

US12115652B2 · kind B2 · utility

0Cited by
7References
22Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 21, 2021
Grant dateOct 15, 2024
Priority date
Expiry dateMar 30, 2042

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG05B2219/39057
  • WIPO fieldHandling
  • WIPO sectorMechanical engineering

Abstract

A system includes a pose manipulation system operationally that sets a pose of a position measurement system with respect to an object that is to be measured. The system further includes a pose tracking system configured to record a relative pose between a coordinate system associated with the position measurement system and a coordinate system of the object. The pose tracking system records a path along which the position measurement system is enabled to measure 3D coordinates of a surface of a type of an object, wherein recording the path comprises moving the pose manipulation system sequentially through a plurality of poses and recording, at each pose, the relative pose to measure the 3D coordinates. The pose manipulation system follows the path again, and the position measurement system measures the 3D coordinates by applying one or more of the recorded poses.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.