Physically unclonable cell using dual-interlocking and error correction techniques
US12131800B2 · kind B2 · utility
1Cited by
25References
24Claims
0Family size
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Key dates
| Filing date | Nov 16, 2022 |
| Grant date | Oct 29, 2024 |
| Priority date | — |
| Expiry date | Mar 7, 2043 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C11/417
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
PUF cells utilizing a dual-interlocking scheme demonstrating improved noise immunity and stability across different V/T conditions and different uses over time in noisy environments. The PUF cell may be advantageously utilized in conjunction with error detection techniques that screen out unstable cells. A set of such PUF cells utilized to generate a device-specific bit pattern, for example a master key.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.