Patent · US Active

CMP polishing pad with enhanced rate

US12138737B2 · kind B2 · utility

0Cited by
4References
8Claims
0Family size

Assignee

Inventor

Key dates

Filing dateMar 31, 2021
Grant dateNov 12, 2024
Priority date
Expiry dateDec 26, 2041

Classification

  • Technology area (CPC B)Performing Operations; Transporting
  • CPC primaryB24B37/042
  • WIPO fieldMachine tools
  • WIPO sectorMechanical engineering

Abstract

A polishing pad having a polishing portion comprising a polymer matrix and rate enhancing lamellar particles that include a phosphate or an arsenate of group III-A or group IV-A metals can be effective in chemical mechanical polishing especially when using a slurry comprising particles having a positive charge in slurry conditions.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.