Metrology system
US12146736B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 23, 2022 |
| Grant date | Nov 19, 2024 |
| Priority date | — |
| Expiry date | Jun 23, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B3/1048
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Apparatuses, systems and methods associated with a metrology system for high-speed, non-contact coordinate measurements of parts are disclosed herein. In embodiments, the metrology system includes a metrology bridge to be coupled to a measurement assembly. The measurement assembly may include a stage moveable across multiple independent axes. The bridge may include a housing, mounting members coupled to the housing, and a plurality of sensors mounted within the housing. The mounting members may rotatably couple the housing to the measurement assembly. Further, sensor elements of the plurality of sensor devices may be aligned along a length of the housing and may be directed out of the housing.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.