Patent · US Active

Polishing pad, manufacturing method thereof and preparing method of semiconductor device using the same

US12162114B2 · kind B2 · utility

0Cited by
0References
17Claims
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Assignee

Inventors

Key dates

Filing dateSep 29, 2021
Grant dateDec 10, 2024
Priority date
Expiry dateDec 1, 2042

Classification

  • Technology area (CPC C)Chemistry; Metallurgy
  • CPC primaryC08J2375/04
  • WIPO fieldMachine tools
  • WIPO sectorMechanical engineering

Abstract

The present disclosure relates to a polishing pad, a method of manufacturing the polishing pad, and a method of manufacturing a semiconductor device using the same. In the polishing pad, an unexpanded solid-phase blowing agent is included in a polishing composition when a polishing layer is manufactured, and the unexpanded solid-phase blowing agent is expanded during a curing process to form a plurality of uniform pores in the polishing layer, such that defects occurring on a surface of the semiconductor substrate may be prevented. In addition, the present disclosure may provide a method of manufacturing a semiconductor device to which the polishing pad is applied.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.