System, apparatus, and method for improved background correction and calibration of optical devices
US12174071B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 11, 2023 |
| Grant date | Dec 24, 2024 |
| Priority date | — |
| Expiry date | May 11, 2043 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J2003/2869
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The disclosure provides features for improved processing of optical data by identifying and characterizing stationary and transient signals in the electrical data representing the data collected from an optical sensor of an optical measurement system. In one example, an optical measurement system is disclosed that includes: (1) a pixel area of an optical sensor having multiple pixels that store an electrical charge corresponding to a received optical signal, (2) one or more reduced illumination regions that provide signal levels intrinsic to the optical sensor, and (3) one or more processors configured to adjust, during active operation of the system, digital representations of the electrical charges from the pixels of the pixel area using characterizations of the signal levels from the one or more reduced illumination regions.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.