Ergonomic loading for a test interface board (TIB) / burn-in-board (BIB) in a slot-based test system
US12174248B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 2, 2022 |
| Grant date | Dec 24, 2024 |
| Priority date | — |
| Expiry date | Nov 17, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2868
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A testing apparatus includes a tester rack with a plurality of slots where at least one slot in the tester rack is a dedicated slot operable to receive a test interface board (TIB) from a back of the tester rack, where the back of the tester rack is opposite a front of a tester rack, and where the front of the tester rack faces a handler and a front-facing elevator. The apparatus also includes a handler operable to load devices under test (DUTs) onto the TIB and a front-facing elevator move the TIB from the dedicated slot to an available slot in the tester rack, wherein the available slot includes power electronics operable to connect to the TIB to test devices under test (DUT) disposed on the TIB.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.