Non-destructive measurement method and apparatus for the turn-to-turn resistivity distribution in non-insulation superconducting coils
US12196792B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 10, 2024 |
| Grant date | Jan 14, 2025 |
| Priority date | — |
| Expiry date | May 10, 2044 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R27/04
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A non-destructive measurement method and apparatus for the turn-to-turn resistivity distribution (TTRD) in non-insulation (NI) superconducting coils. The method includes: during the discharging or charging process, obtaining experimental values of voltage varying over preset time at different positions of the test coil; dividing the test coil into a plurality of measurement units and obtaining basic circuit elements; then constructing a preset equivalent circuit model including the basic circuit elements; based on the constructed equivalent circuit model, obtaining the first simulated values of voltage varying over preset time at different positions of the test coil; finally, determining the TTRD of the test coil based on the fitness value between experimental values and the first simulated values. When there is high fitness value between the first simulated values and experimental values, the TTRD corresponding to the first simulated values is considered as the TTRD within the test coil.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.