Semiconductor device related to calibrating a termination resistance
US12198784B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 1, 2023 |
| Grant date | Jan 14, 2025 |
| Priority date | — |
| Expiry date | Jun 23, 2043 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C2207/2254
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A semiconductor system includes a controller configured to transmit a command address and a plurality of read strobe signals, and a semiconductor device including a first rank and a second rank that are configured to receive the command address and the plurality of read strobe signals and to perform a write operation and a read operation based on the command address. In the semiconductor device, the first rank is configured to calibrate a termination resistance value of the first rank to a target resistance value when a write operation for the first rank is performed. In the semiconductor device, the first rank is configured to calibrate the termination resistance value of the first rank to a dynamic resistance value based on the plurality of read strobe signals when a write operation for the second rank is performed.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.