Gallium arsenide substrate comprising a surface oxide layer with improved surface homogeneity
US12205815B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 10, 2021 |
| Grant date | Jan 21, 2025 |
| Priority date | — |
| Expiry date | Jun 29, 2043 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10T428/24355
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A gallium arsenide substrate which exhibits at least one surface having a surface oxide layer comprising gallium and arsenic oxides and which exhibits at least one surface having, according to an ellipsometric lateral substrate mapping with an optical surface analyzer, based on a substrate diameter of 150 mm as reference, a defect number of <6000 and/or a total defect area of less than 2 cm2, wherein a defect is defined as a continuous area of greater than 1000 μm2 having a deviation from the average measurement signal in elipsometric lateral substrate mapping with an optical surface analyzer of at least ±0.05%.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.